X-ray Diffractometer



The Panalytical X’Pert Pro MPD X-ray powder diffractometer is equipped with a Cu-tube as source, a theta-theta goniometer, stages for powder and thin film samples and a 1D semiconductor X’Celerator detector for fast data acquisition. Modes of operation are powder diffraction, diffraction under grazing incidence, and X-ray reflectivity.

Structural Information

Typical information that can be extracted from X-ray diffractograms by Rietveld refinement are
• phase composition of the crystalline components of the sample
• crystal structure (lattice constants, atom positions, occupation numbers, root mean square displacement)
• microstructure (coherent diffracting domain size, microstrain, crystallinity, densities of extended defects)

Example: CVS nano-TiO2 (anatase, 12 nm)











The instrument is available to users outside the Winterer group upon request.

Unfortunately, at present the instrument is defect. We are working on a proposal for replacement with a new instrument.


The instrument is used extensively for teaching in the NanoEngineering study program:


S. M. Ognjanović, M. Winterer, Optimizing particle characteristics of nanocrystalline aluminum nitride, Powder Technol. 326 (2018) 488-497

C. Klein, M. Vyshnepolsky, A. Kompch, F. Klasing, A. Hanisch-Blicharski, M. Winterer, and M. Horn-von Hoegen, Strain state, film and surface morphology of epitaxial topological insulator Bi2Se3 films on Si(111), Thin. Sol. Films 564 (2014), 241-245

M. Ali, N. Friedenberger, M. Spasova, and M. Winterer, A Novel Approach for Chemical Vapor Synthesis of ZnO Nanocrystals: Optimization of Yield, Crystallinity, Chem. Vap. Dep. 15 (2009) 192-198