The Panalytical X’Pert Pro MPD X-ray powder diffractometer is equipped with a Cu-tube as source, a theta-theta goniometer, stages for powder and thin film samples and a 1D semiconductor X’Celerator detector for fast data acquisition. Modes of operation are powder diffraction, diffraction under grazing incidence, and X-ray reflectivity.
Typical information that can be extracted from X-ray diffractograms by Rietveld refinement are
• phase composition of the crystalline components of the sample
• crystal structure (lattice constants, atom positions, occupation numbers, root mean square displacement)
• microstructure (coherent diffracting domain size, microstrain, crystallinity, densities of extended defects)
Example: CVS nano-TiO2 (anatase, 12 nm)
The instrument is available to users outside the Winterer group upon request.
Unfortunately, at present the instrument is defect. We are working on a proposal for replacement with a new instrument.
The instrument is used extensively for teaching in the NanoEngineering study program:
- NanoEngineering Labcourse (Bachelor)
- Nanocharacterization Labcourse (Bachelor)
- Bachelor projects and Bachelor thesis
- Nanocrystalline Materials Labcourse (Master)
- Master projects and thesis
C. Klein, M. Vyshnepolsky, A. Kompch, F. Klasing, A. Hanisch-Blicharski, M. Winterer, and M. Horn-von Hoegen, Strain state, film and surface morphology of epitaxial topological insulator Bi2Se3 films on Si(111), Thin. Sol. Films 564 (2014), 241-245